Typical TSC spectrum in GaAs and various properties analyzed by its visualization

<p>The data sets of GaAs showing a typical TSC spectrum are given, so that one can experience the analysis of TSC spectrum visualization using these actual data.</p> <p>There are 4 data sheets attached.</p> <p>(1) 1_TSC_GaAs_raw-data.csv</p> <p>TSC measurement of GaAs crystals by photoexcitation shown in Fig.2</p> <p>In the experiment, the temperature of the sample was raised and lowered twice in succession. The 1st signal is the TSC after white light irradiation. The 2nd signal was measured under the condition of temperature rise only. The heating rate was 20 K/min. The collecting voltage was 0.2 V.</p> <p>(2) 2_TSC_GaAs_separated.csv </p> <p>Separated five TSC spectra of GaAs crystal shown in Fig.8 (red lines)</p> <p>(3) 3_TSC_GaAs_reconstructed.csv</p> <p>Reconstructed TSC spectrum of GaAs crystal shown in Fig.8 (black line)</p> <p>(4) 4_visualized_trap-depth_TSC_GaAs.csv</p> <p>Visualized trap-depth characteristic of reconstructed TSC shown in Fig.9 (red dots)</p> <p>Note 1</p> <p>The TSC standard measurement protocol is specified in the following International Electrotechnical Commission (IEC) document.</p> <p>IEC TS 62607-8-1:2020</p> <p>Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current</p> <p><a href="https://webstore.iec.ch/publication/29993" target="_blank">https://webstore.iec.ch/publication/29993</a></p> <p>Note 2</p> <p>Here is a reference for advanced thermally stimulated current (TSC) measurement methods. An asymptotic estimation method was reported that can estimate the escape frequency coefficient from partial TSC curves.</p> <p>Fukuzo Yoshida and Shigeyoshi Maeta, Osaka Institute of Technology</p> <p><a href="https://doi.org/10.1541/ieejfms1990.111.4_323" target="_blank">https://doi.org/10.1541/ieejfms1990.111.4_323</a></p>